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Dielectric current testing and temperature rise measurement due to overcurrent are possible! Low-voltage short-circuit testing device.

For those who want to evaluate the current-carrying performance of products by applying a large current.

Our company uses a "low-voltage short-circuit testing device" to evaluate not only the current resistance performance of products but also, by combining additional measuring instruments, the temperature rise characteristics of products under overcurrent conditions. We also have an explosion-proof chamber, allowing us to safely conduct tests in cases where there is a risk of sample dispersion due to high currents. Additionally, we are equipped with high-speed cameras to observe the samples without missing a moment. Of course, we provide robust support from technical staff with various know-how and expertise. Please feel free to contact us if you have any requests. 【Features】 ■ Capable of applying excessive current to samples ■ Various low voltages can be output by changing the wiring of the device ■ Temperature rise of samples can be monitored by combining measuring instruments *For more details, please download the PDF or feel free to contact us.

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  • Public Testing/Laboratory

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Low Voltage Short Circuit Test Device

The applicable standard is JEM1460! Testing can be conducted without considering the effects of sample scattering.

We would like to introduce the "Low Voltage Short Circuit Test Device" that we handle. This device intentionally creates a short circuit to apply excessive current to the sample. The test voltage can accommodate a wide range of voltages, and in three-phase configurations, both delta and star connections can be set arbitrarily, allowing for voltage output. Additionally, since there is a risk of the sample being damaged and scattering due to the short circuit, the sample is installed inside an explosion-proof chamber. 【Features】 ■ In addition to overcurrent testing of electrical products and short-duration current withstand testing, it is capable of reproducing failure events caused by overcurrent, continuous current testing, and combustion tests of electrical products that simulate tracking. ■ Testing can be conducted without considering the impact of sample scattering. *For more details, please refer to the PDF document or feel free to contact us.

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  • Testing Equipment and Devices

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